Rough Silver for Improved Lead-Frame Reliability

التفاصيل البيبلوغرافية
العنوان: Rough Silver for Improved Lead-Frame Reliability
المؤلفون: Ting, Fai-Lung, So, Ka-Kiu, Lo, Tsz-Chun, Wu, Wei-Gang, Rzeznik, Maria
المصدر: 2023 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2023 China. :1-4 Jun, 2023
Relation: 2023 China Semiconductor Technology International Conference (CSTIC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350311006
9798350310993
DOI:10.1109/CSTIC58779.2023.10219212