The Plasma Etching of the Deep Hole Structure in Silicon with the Mixed Gas of SF6, HBr and O2

التفاصيل البيبلوغرافية
العنوان: The Plasma Etching of the Deep Hole Structure in Silicon with the Mixed Gas of SF6, HBr and O2
المؤلفون: Wang, Qifei, Ma, Yiming, Jiang, Zhongwei, Wang, Jing, Zhu, Haiyun
المصدر: 2023 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2023 China. :1-3 Jun, 2023
Relation: 2023 China Semiconductor Technology International Conference (CSTIC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350311006
9798350310993
DOI:10.1109/CSTIC58779.2023.10219267