Adversarial Defect Synthesis for Industrial Products in Low Data Regime

التفاصيل البيبلوغرافية
العنوان: Adversarial Defect Synthesis for Industrial Products in Low Data Regime
المؤلفون: Coscia, Pasquale, Genovese, Angelo, Scotti, Fabio, Piuri, Vincenzo
المصدر: 2023 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2023 IEEE International Conference on. :1360-1364 Oct, 2023
Relation: 2023 IEEE International Conference on Image Processing (ICIP)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728198354
DOI:10.1109/ICIP49359.2023.10222874