مؤتمر
Adversarial Defect Synthesis for Industrial Products in Low Data Regime
العنوان: | Adversarial Defect Synthesis for Industrial Products in Low Data Regime |
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المؤلفون: | Coscia, Pasquale, Genovese, Angelo, Scotti, Fabio, Piuri, Vincenzo |
المصدر: | 2023 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2023 IEEE International Conference on. :1360-1364 Oct, 2023 |
Relation: | 2023 IEEE International Conference on Image Processing (ICIP) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728198354 |
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DOI: | 10.1109/ICIP49359.2023.10222874 |