مؤتمر
OEST: Outlier Exposure by Simple Transformations for Out-of-Distribution Detection
العنوان: | OEST: Outlier Exposure by Simple Transformations for Out-of-Distribution Detection |
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المؤلفون: | Wu, Yifan, Dai, Songmin, Pan, Dengye, Li, Xiaoqiang |
المصدر: | 2023 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2023 IEEE International Conference on. :2170-2174 Oct, 2023 |
Relation: | 2023 IEEE International Conference on Image Processing (ICIP) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728198354 |
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DOI: | 10.1109/ICIP49359.2023.10222875 |