OEST: Outlier Exposure by Simple Transformations for Out-of-Distribution Detection

التفاصيل البيبلوغرافية
العنوان: OEST: Outlier Exposure by Simple Transformations for Out-of-Distribution Detection
المؤلفون: Wu, Yifan, Dai, Songmin, Pan, Dengye, Li, Xiaoqiang
المصدر: 2023 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2023 IEEE International Conference on. :2170-2174 Oct, 2023
Relation: 2023 IEEE International Conference on Image Processing (ICIP)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728198354
DOI:10.1109/ICIP49359.2023.10222875