A Learning-Based Approach for Single Event Transient Analysis in Pass Transistor Logic

التفاصيل البيبلوغرافية
العنوان:	A Learning-Based Approach for Single Event Transient Analysis in Pass Transistor Logic
المؤلفون:	Zhang, Z., Wu, Z., Weis, C., Wehn, N., Tahoori, M.
المصدر:	2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2023 IEEE 29th International Symposium on. :1-7 Jul, 2023
Relation:	2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
قاعدة البيانات:	IEEE Xplore Digital Library