التفاصيل البيبلوغرافية
العنوان: |
A Learning-Based Approach for Single Event Transient Analysis in Pass Transistor Logic |
المؤلفون: |
Zhang, Z., Wu, Z., Weis, C., Wehn, N., Tahoori, M. |
المصدر: |
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2023 IEEE 29th International Symposium on. :1-7 Jul, 2023 |
Relation: |
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |