التفاصيل البيبلوغرافية
| العنوان: |
A Semantic Model to Express Process Parameters and their Interdependencies in Manufacturing |
| المؤلفون: |
Jeleniewski, Tom, Nabizada, Hamied, Reif, Jonathan, Kocher, Aljosha, Fay, Alexander |
| المصدر: |
2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) Industrial Electronics (ISIE), 2023 IEEE 32nd International Symposium on. :1-6 Jun, 2023 |
| Relation: |
2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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