مؤتمر
AFM Imaging Defect Detection and Classification with Artificial Intelligence and Deep Learning
| العنوان: | AFM Imaging Defect Detection and Classification with Artificial Intelligence and Deep Learning |
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| المؤلفون: | Zhang, Juntao, Ren, Juan, Hu, Shuiqing |
| المصدر: | 2023 IEEE 23rd International Conference on Nanotechnology (NANO) Nanotechnology (NANO), 2023 IEEE 23rd International Conference on. :447-452 Jul, 2023 |
| Relation: | 2023 IEEE 23rd International Conference on Nanotechnology (NANO) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350333466 |
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| تدمد: | 19449380 |
| DOI: | 10.1109/NANO58406.2023.10231258 |