Highly Sensitive Plasmonic Terahertz Detector with Integrated Sub-Wavelength Aperture Based on Asymmetric FET in 65-nm CMOS Technology

التفاصيل البيبلوغرافية
العنوان:	Highly Sensitive Plasmonic Terahertz Detector with Integrated Sub-Wavelength Aperture Based on Asymmetric FET in 65-nm CMOS Technology
المؤلفون:	Kim, Min Jae, Ahn, Sang Hyo, Song, Yoo Bin, Ryu, Min Woo, Kim, Kyung Rok
المصدر:	2023 IEEE 23rd International Conference on Nanotechnology (NANO) Nanotechnology (NANO), 2023 IEEE 23rd International Conference on. :861-865 Jul, 2023
Relation:	2023 IEEE 23rd International Conference on Nanotechnology (NANO)
قاعدة البيانات:	IEEE Xplore Digital Library