مؤتمر
Automated Detection of Coffee Bean Defects using Multi-Deep Learning Models
| العنوان: | Automated Detection of Coffee Bean Defects using Multi-Deep Learning Models |
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| المؤلفون: | Liang, Chuan-Shiuan, Xu, Zhe-Yu, Zhou, Jian-Yu, Yang, Chieh-Ming, Chen, Jen-Yeu |
| المصدر: | 2023 VTS Asia Pacific Wireless Communications Symposium (APWCS) Wireless Communications Symposium (APWCS), 2023 VTS Asia Pacific. :1-5 Aug, 2023 |
| Relation: | 2023 VTS Asia Pacific Wireless Communications Symposium (APWCS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350316803 |
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| DOI: | 10.1109/APWCS60142.2023.10234059 |