مؤتمر
Invited: Pre-silicon Side Channel and Fault Analysis
| العنوان: | Invited: Pre-silicon Side Channel and Fault Analysis |
|---|---|
| المؤلفون: | van Woudenberg, Jasper, Grossmann, Peter, Varna, Avinash L., Friel, Joseph, Dinu, Daniel, Lindsay, Ronnie, Brown, Steve J. |
| المصدر: | 2023 60th ACM/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2023 60th ACM/IEEE. :1-4 Jul, 2023 |
| Relation: | 2023 60th ACM/IEEE Design Automation Conference (DAC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350323481 |
|---|---|
| DOI: | 10.1109/DAC56929.2023.10247882 |