التفاصيل البيبلوغرافية
| العنوان: |
Hardware Security Assessment through Repair of Damaged Device |
| المؤلفون: |
Sim, S. Y., Liu, Q., Kor, H. B., Gan, C. L. |
| المصدر: |
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-5 Jul, 2023 |
| Relation: |
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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