التفاصيل البيبلوغرافية
| العنوان: |
AlGaN/GaN RF Power Amplifier Failure Analysis and Backside Via Etching Process Improvement |
| المؤلفون: |
Shi, Lin, Wang, Chong, Cai, Xiaolong, Zheng, Xuefeng, Liu, Haijun |
| المصدر: |
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-4 Jul, 2023 |
| Relation: |
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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