مؤتمر
Defect Isolation of Functional Failed 3D NAND Device Memory Using Memory Tester and Test Bench with OBIRCH
العنوان: | Defect Isolation of Functional Failed 3D NAND Device Memory Using Memory Tester and Test Bench with OBIRCH |
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المؤلفون: | Lim, Yong Cheng, Gan, Yong Yang, Loke, Bee Chin |
المصدر: | 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-4 Jul, 2023 |
Relation: | 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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