دورية أكاديمية
Impact of Trap States at Deep Trench Sidewalls on the Responsivity of Island Photodiodes
| العنوان: | Impact of Trap States at Deep Trench Sidewalls on the Responsivity of Island Photodiodes |
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| المؤلفون: | Stampfer, P., Roger, F., Grasser, T., Waltl, M. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(11):5738-5744 Nov, 2023 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2023.3315225 |