التفاصيل البيبلوغرافية
| العنوان: |
Neutron Induced Single Event Testing of Commercial Ferroelectric Memory Device (FRAM) |
| المؤلفون: |
Deaton., Terrence F., Tostanoski, Michael J., Peters, Michael K., Hartojo, Kristianto, Lachiewicz, Gerard, Fullem, Travis Z. |
| المصدر: |
2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023 IEEE. :1-6 Jul, 2023 |
| Relation: |
2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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