مؤتمر
The Characterization of Near-Field Microwave Radiation Via Scanning Probe Microscopy
| العنوان: | The Characterization of Near-Field Microwave Radiation Via Scanning Probe Microscopy |
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| المؤلفون: | Pei, Tao, Xue, Yifan, Wang, Caihui, Wei, Guoliang, Wen, Huanfei, Tang, Jun, Liu, Jun |
| المصدر: | 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2023 IEEE 16th International Conference on. :374-378 Aug, 2023 |
| Relation: | 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350327144 9798350327137 |
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| DOI: | 10.1109/ICEMI59194.2023.10270446 |