مؤتمر
Research on Self-Learning Flaw Detection in Ultrasonic C-Scan Non-Destructive Testing
| العنوان: | Research on Self-Learning Flaw Detection in Ultrasonic C-Scan Non-Destructive Testing |
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| المؤلفون: | Li, Zhipeng, Shi, Yibing, Li, Yanjun, Zhang, Wei, Qiu, Ao |
| المصدر: | 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2023 IEEE 16th International Conference on. :401-405 Aug, 2023 |
| Relation: | 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350327144 9798350327137 |
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| DOI: | 10.1109/ICEMI59194.2023.10270734 |