مؤتمر
Research on Self-Learning Flaw Detection in Ultrasonic C-Scan Non-Destructive Testing
العنوان: | Research on Self-Learning Flaw Detection in Ultrasonic C-Scan Non-Destructive Testing |
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المؤلفون: | Li, Zhipeng, Shi, Yibing, Li, Yanjun, Zhang, Wei, Qiu, Ao |
المصدر: | 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2023 IEEE 16th International Conference on. :401-405 Aug, 2023 |
Relation: | 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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