مؤتمر
Clone Detection in IEC 61499 using Metainformation
العنوان: | Clone Detection in IEC 61499 using Metainformation |
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المؤلفون: | Kutsia, Elene, Sonnleithner, Lisa, Rabiser, Rick, Zoitl, Alois |
المصدر: | 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) Emerging Technologies and Factory Automation (ETFA), 2023 IEEE 28th International Conference on. :1-4 Sep, 2023 |
Relation: | 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350339918 9798350339901 |
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تدمد: | 19460759 |
DOI: | 10.1109/ETFA54631.2023.10275611 |