Coupling Path Identification of Conducted EMI in a High-Voltage Discharging Circuit Using Near-Field Scanning

التفاصيل البيبلوغرافية
العنوان: Coupling Path Identification of Conducted EMI in a High-Voltage Discharging Circuit Using Near-Field Scanning
المؤلفون: Xie, Yu-Ting, Zhang, Ling, Chen, Jun-Hui, Li, Da, Yang, Zhen-Zhong, Li, Er-Ping
المصدر: 2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT) Microwave and Millimeter Wave Technology (ICMMT), 2023 International Conference on. :1-3 May, 2023
Relation: 2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350338874
DOI:10.1109/ICMMT58241.2023.10277466