مؤتمر
Methods for Various Levels of Testing During Development of a Communication Interface Board
| العنوان: | Methods for Various Levels of Testing During Development of a Communication Interface Board |
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| المؤلفون: | Atabay, Ersin, Toku, Hadi Alper |
| المصدر: | 2023 IEEE AUTOTESTCON AUTOTESTCON, 2023 IEEE. :1-5 Aug, 2023 |
| Relation: | 2023 IEEE AUTOTESTCON |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350300284 |
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| تدمد: | 15584550 |
| DOI: | 10.1109/AUTOTESTCON47464.2023.10296448 |