مؤتمر
Trustworthy Lifetime Prediction by Aging History Analysis and Multi-Level Stress Test
| العنوان: | Trustworthy Lifetime Prediction by Aging History Analysis and Multi-Level Stress Test |
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| المؤلفون: | Tsai, Chen-Lin, Huang, Shi-Yu |
| المصدر: | 2023 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2023 IEEE International. :1-6 Sep, 2023 |
| Relation: | 2023 IEEE International Test Conference in Asia (ITC-Asia) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350312812 |
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| تدمد: | 2768069X |
| DOI: | 10.1109/ITC-Asia58802.2023.10301189 |