A Morphology Control Method of Submicron SiO2 Arrays in CHF3/Ar Inductively Coupled Plasma Etching

التفاصيل البيبلوغرافية
العنوان: A Morphology Control Method of Submicron SiO2 Arrays in CHF3/Ar Inductively Coupled Plasma Etching
المؤلفون: Zhang, Zhibo, Dong, Litong, Wang, Lu, Ouyang, Mingzhao, Liu, Mengnan, Wang, Zuobin
المصدر: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2023 IEEE International Conference on. :272-275 Jul, 2023
Relation: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350344486
تدمد:2694510X
DOI:10.1109/3M-NANO58613.2023.10305361