التفاصيل البيبلوغرافية
| العنوان: |
A Block Partitioning Method for Region Exhaustive Test to Reduce the Number of Test Patterns and Improve Gate Exhaustive Fault Coverage |
| المؤلفون: |
Mizota, Momona, Hosokawa, Toshinori, Yoshimura, Masayoshi, Arai, Masayuki |
| المصدر: |
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023 |
| Relation: |
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
