Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit

التفاصيل البيبلوغرافية
العنوان: Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit
المؤلفون: Imianosky, Carolina, Santos, Douglas A., Melo, Douglas R., VieE, Felipe, Dilillo, Luigi
المصدر: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023
Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350315004
تدمد:2765933X
DOI:10.1109/DFT59622.2023.10313569