التفاصيل البيبلوغرافية
العنوان: |
Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit |
المؤلفون: |
Imianosky, Carolina, Santos, Douglas A., Melo, Douglas R., VieE, Felipe, Dilillo, Luigi |
المصدر: |
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023 |
Relation: |
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
قاعدة البيانات: |
IEEE Xplore Digital Library |