التفاصيل البيبلوغرافية
| العنوان: |
An Evaluation of Estimated Field Random Testability for Data Paths at Register Transfer Level Using Status Signal Sequences Based on k-Consecutive State Transitions for Field Testing |
| المؤلفون: |
Toyooka, Yudai, Watanabe, Haruki, Hosokawa, Toshinori, Yoshimura, Masayoshi |
| المصدر: |
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023 |
| Relation: |
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
