دورية أكاديمية
Test Insertion for Dynamic Test Compaction
العنوان: | Test Insertion for Dynamic Test Compaction |
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المؤلفون: | Pomeranz, I. |
المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 43(4):1302-1306 Apr, 2024 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 02780070 19374151 |
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DOI: | 10.1109/TCAD.2023.3332835 |