دورية أكاديمية
Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient
| العنوان: | Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient |
|---|---|
| المؤلفون: | Shi, Z., Xiao, J., Jiang, J., Zhang, Y., Zhou, Y. |
| المصدر: | IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 71(4):2319-2323 Apr, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15497747 15583791 |
|---|---|
| DOI: | 10.1109/TCSII.2023.3334390 |