مؤتمر
Strip Pickling Defect Detection Based on Improved YOLOv5s Algorithm
| العنوان: | Strip Pickling Defect Detection Based on Improved YOLOv5s Algorithm |
|---|---|
| المؤلفون: | Zhu, Xiaoyan, Zhang, Mingyu, Liu, Yong, Wan, Xin, Wang, Xiwen, Zhou, Peng |
| المصدر: | 2023 35th Chinese Control and Decision Conference (CCDC) Control and Decision Conference (CCDC), 2023 35th Chinese. :2234-2238 May, 2023 |
| Relation: | 2023 35th Chinese Control and Decision Conference (CCDC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350334722 9798350334715 |
|---|---|
| تدمد: | 19489447 |
| DOI: | 10.1109/CCDC58219.2023.10326882 |