التفاصيل البيبلوغرافية
| العنوان: |
Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator N-FETs: The Impact of Back Bias, Strain, and Hot Carrier Stress |
| المؤلفون: |
Li, Xinze, Wu, Yuxuan, Teng, Qiao, Sun, Ying, Gong, Xiao, Besnard, Guillaume, Maleville, Christophe, Weber, Olivier, Zhang, Rui, Chen, Bing, Gao, Dawei, Cheng, Ran |
| المصدر: |
2023 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2023 International Conference on. :116-119 Sep, 2023 |
| Relation: |
2023 International Conference on IC Design and Technology (ICICDT) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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