Development of a High Count-Rate X-ray Detector with Backscattering Geometry for Synchrotron Applications

التفاصيل البيبلوغرافية
العنوان: Development of a High Count-Rate X-ray Detector with Backscattering Geometry for Synchrotron Applications
المؤلفون: Ticchi, G., Pedretti, B., Bernardini, L., Forgione, A., Di Vita, D., Carminati, M., Borghi, G., Zorzi, N., Falkenberg, G., Fiorini, C. E.
المصدر: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD), 2023 IEEE. :1-1 Nov, 2023
Relation: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350338669
تدمد:25770829
DOI:10.1109/NSSMICRTSD49126.2023.10338808