دورية أكاديمية

SET-Induced Dropout and Recovery of Cross-Coupled and Differential-Colpitts Microwave Oscillators Using SiGe HBTs

التفاصيل البيبلوغرافية
العنوان: SET-Induced Dropout and Recovery of Cross-Coupled and Differential-Colpitts Microwave Oscillators Using SiGe HBTs
المؤلفون: Teng, J.W., Mensah, Y.A., Brumbach, Z.R., Ildefonso, A., Khachatrian, A., McMorrow, D., Cressler, J.D.
المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):830-838 Apr, 2024
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
تدمد:00189499
15581578
DOI:10.1109/TNS.2023.3341754