دورية أكاديمية
Side-Channel Attack Resilient RHBD 12T SRAM Cell for Secure Nuclear Environment
العنوان: | Side-Channel Attack Resilient RHBD 12T SRAM Cell for Secure Nuclear Environment |
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المؤلفون: | Naz, S.F., Mondal, D., Shah, A.P. |
المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(1):59-67 Mar, 2024 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 15304388 15582574 |
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DOI: | 10.1109/TDMR.2023.3346752 |