مؤتمر
AUTG: An Automatic UVM-based TestBench Generator for VLSI Chip Design Verification
العنوان: | AUTG: An Automatic UVM-based TestBench Generator for VLSI Chip Design Verification |
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المؤلفون: | Ismael, Mohammad, Hroub, Ayman, Abu-Issa, Abdellatif |
المصدر: | 2023 International Conference on Microelectronics (ICM) Microelectronics (ICM), 2023 International Conference on. :162-167 Dec, 2023 |
Relation: | 2023 International Conference on Microelectronics (ICM) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350380828 |
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تدمد: | 21591679 |
DOI: | 10.1109/ICM60448.2023.10378885 |