AUTG: An Automatic UVM-based TestBench Generator for VLSI Chip Design Verification

التفاصيل البيبلوغرافية
العنوان: AUTG: An Automatic UVM-based TestBench Generator for VLSI Chip Design Verification
المؤلفون: Ismael, Mohammad, Hroub, Ayman, Abu-Issa, Abdellatif
المصدر: 2023 International Conference on Microelectronics (ICM) Microelectronics (ICM), 2023 International Conference on. :162-167 Dec, 2023
Relation: 2023 International Conference on Microelectronics (ICM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350380828
تدمد:21591679
DOI:10.1109/ICM60448.2023.10378885