Fault simulation Framework using PyUVM

التفاصيل البيبلوغرافية
العنوان: Fault simulation Framework using PyUVM
المؤلفون: Fayez, Mina Hanna, ElAdawy, Mohamed Ahmed, Sahyon, Micheal Safwat, Ahmed, Islam Osama, El-Din, Omar Hossam, ElShafie, Mohamed Ahmed, Taha, Mohamed Ayman, Talaat, Mohamed Gamal
المصدر: 2023 International Conference on Microelectronics (ICM) Microelectronics (ICM), 2023 International Conference on. :158-161 Dec, 2023
Relation: 2023 International Conference on Microelectronics (ICM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350380828
تدمد:21591679
DOI:10.1109/ICM60448.2023.10378910