مؤتمر
A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS
| العنوان: | A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS |
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| المؤلفون: | Ash, Andrew, Hu, John |
| المصدر: | 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2023 IEEE 66th International Midwest Symposium on. :167-171 Aug, 2023 |
| Relation: | 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350302103 |
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| تدمد: | 15583899 |
| DOI: | 10.1109/MWSCAS57524.2023.10405901 |