مؤتمر
A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS
العنوان: | A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS |
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المؤلفون: | Ash, Andrew, Hu, John |
المصدر: | 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2023 IEEE 66th International Midwest Symposium on. :167-171 Aug, 2023 |
Relation: | 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350302103 |
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تدمد: | 15583899 |
DOI: | 10.1109/MWSCAS57524.2023.10405901 |