التفاصيل البيبلوغرافية
| العنوان: |
TCAD Calibrated SEE Fault Model Validated with Beam Results for a 12nm D Flip-Flop. |
| المؤلفون: |
YoungSciortino, Clifford, Neuendank, Jereme, Clark, Lawrence T., Barnaby, Hugh, Wilson, Donald, Spear, Matthew, Privat, Aymeric, Marinella, Matthew J. |
| المصدر: |
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2022 22nd European Conference on. :1-6 Oct, 2022 |
| Relation: |
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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