دورية أكاديمية
MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method
العنوان: | MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method |
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المؤلفون: | Yan, A., Li, Z., Gao, Z., Zhang, J., Huang, Z., Ni, T., Cui, J., Wang, X., Girard, P., Wen, X. |
المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 43(7):2205-2214 Jul, 2024 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 02780070 19374151 |
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DOI: | 10.1109/TCAD.2024.3357593 |