دورية أكاديمية

MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method

التفاصيل البيبلوغرافية
العنوان: MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method
المؤلفون: Yan, A., Li, Z., Gao, Z., Zhang, J., Huang, Z., Ni, T., Cui, J., Wang, X., Girard, P., Wen, X.
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 43(7):2205-2214 Jul, 2024
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
تدمد:02780070
19374151
DOI:10.1109/TCAD.2024.3357593