مؤتمر
Reversing a decades-long scaling law of dielectric breakdown for ReRAM forming voltage reduction - Modeling competition among defect generation and annihilation processes (invited)
| العنوان: | Reversing a decades-long scaling law of dielectric breakdown for ReRAM forming voltage reduction - Modeling competition among defect generation and annihilation processes (invited) |
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| المؤلفون: | Wu, Ernest, Ando, Takashi, Jamison, Paul |
| المصدر: | 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023 |
| Relation: | 2023 International Electron Devices Meeting (IEDM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350327670 |
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| تدمد: | 2156017X |
| DOI: | 10.1109/IEDM45741.2023.10413665 |