التفاصيل البيبلوغرافية
| العنوان: |
Low N-Type Contact Resistance to Carbon Nanotubes in Highly Scaled Contacts through Dielectric Doping |
| المؤلفون: |
Safron, N., Chiu, H.-Y., Chao, T.-A., Su, S.-K., Passlack, M., Chiu, K.-H., Chen, C.-W., Kei, C.-C., Chou, C.-H., Lee, T.-E., Wang, J.-F., Chang, C.-S., Liew, S.-L., Hou, V.D.H., Wang, H., Chang, W.-H., Wong, H.-S.P., Pitner, G., Chien, C.-H., Radu, I.P. |
| المصدر: |
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023 |
| Relation: |
2023 International Electron Devices Meeting (IEDM) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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