مؤتمر
Application of high-quality built-in test to industrial designs
| العنوان: | Application of high-quality built-in test to industrial designs |
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| المؤلفون: | Hatayama, K., Nakao, M., Kiyoshige, Y., Natsume, K., Sato, Y., Nagumo, T. |
| المصدر: | Proceedings. International Test Conference International test conference Test Conference, 2002. Proceedings. International. :1003-1012 2002 |
| Relation: | International Test Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780375424 9780780375420 |
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| تدمد: | 10893539 |
| DOI: | 10.1109/TEST.2002.1041856 |