التفاصيل البيبلوغرافية
العنوان: |
Simulation of Tip Defect Discharge Process under the Influence of Multiple Physical Fields |
المؤلفون: |
Luo, Yingting, Wang, Lei, Jiang, Junfei, Xu, Hailin, Shenglong, E, Lai, Shiyu |
المصدر: |
2023 5th International Conference on Electrical Engineering and Control Technologies (CEECT) Electrical Engineering and Control Technologies (CEECT), 2023 5th International Conference on. :313-319 Dec, 2023 |
Relation: |
2023 5th International Conference on Electrical Engineering and Control Technologies (CEECT) |
قاعدة البيانات: |
IEEE Xplore Digital Library |