Simulation of Tip Defect Discharge Process under the Influence of Multiple Physical Fields

التفاصيل البيبلوغرافية
العنوان: Simulation of Tip Defect Discharge Process under the Influence of Multiple Physical Fields
المؤلفون: Luo, Yingting, Wang, Lei, Jiang, Junfei, Xu, Hailin, Shenglong, E, Lai, Shiyu
المصدر: 2023 5th International Conference on Electrical Engineering and Control Technologies (CEECT) Electrical Engineering and Control Technologies (CEECT), 2023 5th International Conference on. :313-319 Dec, 2023
Relation: 2023 5th International Conference on Electrical Engineering and Control Technologies (CEECT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350342253
DOI:10.1109/CEECT59667.2023.10420539