التفاصيل البيبلوغرافية
| العنوان: |
Investigation of Cylindrical Gate All Around Field Effect Transistors Exploring Variation in Low Voltage Using Visual TCAD |
| المؤلفون: |
Krishna, Raji, Srujana, B., Jayanthi, D., Kavitha, K., Maurya, Naveen |
| المصدر: |
2023 International Conference on Next Generation Electronics (NEleX) Next Generation Electronics (NEleX), 2023 International Conference on. :1-5 Dec, 2023 |
| Relation: |
2023 International Conference on Next Generation Electronics (NEleX) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
