مؤتمر
An End-to-End S-AF-RCNN based Framework for Just-in-Time Defect Prediction
| العنوان: | An End-to-End S-AF-RCNN based Framework for Just-in-Time Defect Prediction |
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| المؤلفون: | Nirmalraj, R.J.T., Ramalingam, Pon, Sreetharan, V., Ali Khan, P.M.D., Divya, N, Ponnusamy, Muruganantham |
| المصدر: | 2023 3rd International Conference on Innovative Mechanisms for Industry Applications (ICIMIA) Innovative Mechanisms for Industry Applications (ICIMIA), 2023 3rd International Conference on. :305-310 Dec, 2023 |
| Relation: | 2023 3rd International Conference on Innovative Mechanisms for Industry Applications (ICIMIA) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350343632 9798350343625 |
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| DOI: | 10.1109/ICIMIA60377.2023.10426557 |