VIE-DDM Based PEEC Method with Parallel Technology for DC Analysis of Packaging Circuit

التفاصيل البيبلوغرافية
العنوان: VIE-DDM Based PEEC Method with Parallel Technology for DC Analysis of Packaging Circuit
المؤلفون: Zhou, Tao, Cai, Qiang-Ming, Li, Yixiang, Cao, Xin, Du, Zhenyong, Fan, Jun
المصدر: 2023 Asia-Pacific Microwave Conference (APMC) Microwave Conference (APMC), 2023 Asia-Pacific. :456-458 Dec, 2023
Relation: 2023 Asia-Pacific Microwave Conference (APMC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665494182
DOI:10.1109/APMC57107.2023.10439934