مؤتمر
Fabric defect classification using wavelet frames and minimum classification error training
العنوان: | Fabric defect classification using wavelet frames and minimum classification error training |
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المؤلفون: | Xuezhi Yang, Pang, G., Yung, N. |
المصدر: | Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting (Cat. No.02CH37344) Industry applications conference Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the. 1:290-296 vol.1 2002 |
Relation: | Proceedings of 2002 IEEE Industry Applications Society Annual Meeting |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780374207 9780780374201 |
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تدمد: | 01972618 |
DOI: | 10.1109/IAS.2002.1044102 |