Fabric defect classification using wavelet frames and minimum classification error training

التفاصيل البيبلوغرافية
العنوان: Fabric defect classification using wavelet frames and minimum classification error training
المؤلفون: Xuezhi Yang, Pang, G., Yung, N.
المصدر: Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting (Cat. No.02CH37344) Industry applications conference Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the. 1:290-296 vol.1 2002
Relation: Proceedings of 2002 IEEE Industry Applications Society Annual Meeting
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780374207
9780780374201
تدمد:01972618
DOI:10.1109/IAS.2002.1044102