دورية أكاديمية
Complex Defects Detection of 3-D-Printed Lattice Structures: Accuracy and Scale Improvement in YOLO V7
| العنوان: | Complex Defects Detection of 3-D-Printed Lattice Structures: Accuracy and Scale Improvement in YOLO V7 |
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| المؤلفون: | Wen, Y., Cheng, J., Ren, Y., Feng, Y., Zhang, Z., Zhang, Y. |
| المصدر: | IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-9 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189456 15579662 |
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| DOI: | 10.1109/TIM.2024.3370765 |