التفاصيل البيبلوغرافية
العنوان: |
Fault Diagnosis of Indium Tin Oxide Electrodes by Multi-channel S-parameter Patterns |
المؤلفون: |
Suh, Sungho, Lee, Haebom, Kang, Tae Yeob |
المصدر: |
2024 International Conference on Electronics, Information, and Communication (ICEIC) Electronics, Information, and Communication (ICEIC), 2024 International Conference on. :1-4 Jan, 2024 |
Relation: |
2024 International Conference on Electronics, Information, and Communication (ICEIC) |
قاعدة البيانات: |
IEEE Xplore Digital Library |