Fault Diagnosis of Indium Tin Oxide Electrodes by Multi-channel S-parameter Patterns

التفاصيل البيبلوغرافية
العنوان:	Fault Diagnosis of Indium Tin Oxide Electrodes by Multi-channel S-parameter Patterns
المؤلفون:	Suh, Sungho, Lee, Haebom, Kang, Tae Yeob
المصدر:	2024 International Conference on Electronics, Information, and Communication (ICEIC) Electronics, Information, and Communication (ICEIC), 2024 International Conference on. :1-4 Jan, 2024
Relation:	2024 International Conference on Electronics, Information, and Communication (ICEIC)
قاعدة البيانات:	IEEE Xplore Digital Library