Process and Integration Challenges for Via Last TSV (from top) on Functional LNA SOI wafers for 3D Heterogeneous chiplet integration

التفاصيل البيبلوغرافية
العنوان: Process and Integration Challenges for Via Last TSV (from top) on Functional LNA SOI wafers for 3D Heterogeneous chiplet integration
المؤلفون: Wang, Xiangyu, Rotaru, Mihai Dragos, Haitao, Yu, Jonq, Mingchinq, Chong, Chai Tai, Chui, King-Jien
المصدر: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) Electronics Packaging Technology Conference (EPTC), 2023 IEEE 25th. :116-119 Dec, 2023
Relation: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350329575
DOI:10.1109/EPTC59621.2023.10457623